Elements of X-ray Diffraction |
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Page 140
... distance ( usually 5 cm ) . Adjust- ment of the specimen - to - film distance is best made by using a feeler gauge of the correct length . The voltage applied to the x - ray tube has a decided effect on the appear- ance of a ...
... distance ( usually 5 cm ) . Adjust- ment of the specimen - to - film distance is best made by using a feeler gauge of the correct length . The voltage applied to the x - ray tube has a decided effect on the appear- ance of a ...
Page 154
... distance is impressed on the film which will shrink in the same proportion as the distance between a given pair of diffraction lines . If the angular separation 40k of the knife - edges in the camera is known , either by direct ...
... distance is impressed on the film which will shrink in the same proportion as the distance between a given pair of diffraction lines . If the angular separation 40k of the knife - edges in the camera is known , either by direct ...
Page 228
... distance OS may be measured . The distance PQ correspond- ing to each distance OS is then calculated from Eqs . ( 8-1 ) and ( 8-3 ) , and marked off from the center of the ruler in the opposite direction . Corresponding gradua- tions ...
... distance OS may be measured . The distance PQ correspond- ing to each distance OS is then calculated from Eqs . ( 8-1 ) and ( 8-3 ) , and marked off from the center of the ruler in the opposite direction . Corresponding gradua- tions ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone