Elements of X-Ray Diffraction |
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Page 154
The pattern is symmetrical on either side, and the 6 value of a particular reflection
is obtained by measuring U, the distance apart of two diffraction lines formed by
the same cone of radiation, and using the relation 40fl = U. Photographic film ...
The pattern is symmetrical on either side, and the 6 value of a particular reflection
is obtained by measuring U, the distance apart of two diffraction lines formed by
the same cone of radiation, and using the relation 40fl = U. Photographic film ...
Page 170
Moreover, since the diffracted rays all originate on a circle passing through the
source S, they will converge to a focus at F, located on the same circle as S and
at the same distance from C, in much the same way as in the focusing cameras ...
Moreover, since the diffracted rays all originate on a circle passing through the
source S, they will converge to a focus at F, located on the same circle as S and
at the same distance from C, in much the same way as in the focusing cameras ...
Page 228
Because the triangles TUQ and TMC are similar, R = 2r and PQ = ft tan (8-3) The
ruler is constructed by marking off, from a central point, a scale of centimeters by
which the distance OS may be measured. The distance PQ corresponding to ...
Because the triangles TUQ and TMC are similar, R = 2r and PQ = ft tan (8-3) The
ruler is constructed by marking off, from a central point, a scale of centimeters by
which the distance OS may be measured. The distance PQ corresponding to ...
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Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone
Bibliographic information
| Title | Elements of X-Ray Diffraction Addison-Wesley metallurgy series Addison-Wesley series in metallurgy and materials engineering |
| Author | Bernard Dennis Cullity |
| Publisher | Addison-Wesley Publishing Company, 1959 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |