Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 54
Page 10
... electron out of the K shell of a target atom . If WK is the work required to remove a K electron , then the necessary kinetic energy of the electrons is given by mv2 = WK . ( 1-8 ) It requires less energy to remove an L electron than a K ...
... electron out of the K shell of a target atom . If WK is the work required to remove a K electron , then the necessary kinetic energy of the electrons is given by mv2 = WK . ( 1-8 ) It requires less energy to remove an L electron than a K ...
Page 191
... electrons and ions will be collected on the electrodes , and , if the x - ray intensity is constant , there will be ... electrons produced by the primary ionization are rapidly accelerated toward the wire anode and at an ever increasing ...
... electrons and ions will be collected on the electrodes , and , if the x - ray intensity is constant , there will be ... electrons produced by the primary ionization are rapidly accelerated toward the wire anode and at an ever increasing ...
Page 486
... electrons and neutrons have proved to be useful particles for the study of crystalline structure by diffraction and numerous applications of these techniques have been found in metal- lurgy . The differences between x - ray , electron ...
... electrons and neutrons have proved to be useful particles for the study of crystalline structure by diffraction and numerous applications of these techniques have been found in metal- lurgy . The differences between x - ray , electron ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone