Elements of X-ray Diffraction |
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Page 407
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
Page 417
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
Page 488
... Elements with almost the same values of Z may have quite different neutron - scattering powers and elements with widely separated values of Z may scatter neutrons equally well . Furthermore , some light elements scatter neutrons more ...
... Elements with almost the same values of Z may have quite different neutron - scattering powers and elements with widely separated values of Z may scatter neutrons equally well . Furthermore , some light elements scatter neutrons more ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone