Elements of X-ray Diffraction |
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Page 31
... equal axes , equally inclined Rhombohedral α = = b = = C , a = B = Y 90 ° Simple R Hexagonal Two equal coplanar axes at 120 ° , third axis at right angles Simple P a = bc . a = B = 90 ° , γ = 120 ° Three unequal axes , Simple P ...
... equal axes , equally inclined Rhombohedral α = = b = = C , a = B = Y 90 ° Simple R Hexagonal Two equal coplanar axes at 120 ° , third axis at right angles Simple P a = bc . a = B = 90 ° , γ = 120 ° Three unequal axes , Simple P ...
Page 157
... equal to one another and equal to half the angle subtended at the center by the same arc . Suppose that x - rays proceeding in the directions SA and SB encounter a powder speci- men located on the arc AB . Then the rays diffracted by ...
... equal to one another and equal to half the angle subtended at the center by the same arc . Suppose that x - rays proceeding in the directions SA and SB encounter a powder speci- men located on the arc AB . Then the rays diffracted by ...
Page 327
... equal to 20N , or AS ' = 20N = 2Ax sin 24 . ( 11-6 ) The effect of a specimen displacement at right angles to the incident beam [ Fig . 11-3 ( b ) ] is to shift the lines from A to C and from B to D. When Ay is small , AC is very nearly ...
... equal to 20N , or AS ' = 20N = 2Ax sin 24 . ( 11-6 ) The effect of a specimen displacement at right angles to the incident beam [ Fig . 11-3 ( b ) ] is to shift the lines from A to C and from B to D. When Ay is small , AC is very nearly ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone