Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 47
Page 326
... error AS ' in the quantity S ' . The camera radius may also be in error by an amount AR . The effects of these two errors on the value of & may be found by writing Eq . ( 11-3 ) in logarithmic form : In In S ' In 4 In R. o ...
... error AS ' in the quantity S ' . The camera radius may also be in error by an amount AR . The effects of these two errors on the value of & may be found by writing Eq . ( 11-3 ) in logarithmic form : In In S ' In 4 In R. o ...
Page 327
... error can be minimized by loading the film so that the inci- dent beam enters through a hole in the film , since corresponding back- reflection lines are then only a short distance apart on the film , and their separation S ' is little ...
... error can be minimized by loading the film so that the inci- dent beam enters through a hole in the film , since corresponding back- reflection lines are then only a short distance apart on the film , and their separation S ' is little ...
Page 328
... error refers to the possibility that the axis of rotation of the shaft is not located at the center of the camera , due to improper construction of the camera . Absorption in the specimen also causes an error in ø . This effect , often ...
... error refers to the possibility that the axis of rotation of the shaft is not located at the center of the camera , due to improper construction of the camera . Absorption in the specimen also causes an error in ø . This effect , often ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone