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Results 1-3 of 35
Page 204
The probable error” in a single count of N pulses, relative to an average value
obtained by a great many repetitions of the same counting operation, is given by -
67 EN = —7+ percent, (7–6) v/N so long as N is fairly large. For some of the total
...
The probable error” in a single count of N pulses, relative to an average value
obtained by a great many repetitions of the same counting operation, is given by -
67 EN = —7+ percent, (7–6) v/N so long as N is fairly large. For some of the total
...
Page 327
The shrinkage error can be minimized by loading the film so that the incident
beam enters through a hole in the film, since corresponding backreflection lines
are then only a short distance apart on the film, and their separation S' is little ...
The shrinkage error can be minimized by loading the film so that the incident
beam enters through a hole in the film, since corresponding backreflection lines
are then only a short distance apart on the film, and their separation S' is little ...
Page 328
Bernard Dennis Cullity. which shows how an error in S'alone affects the value of
4. By combining Eqs. (11–3), (11–6), and (11–7), we find that the error in 4 due to
the fact that the specimen is off center is given by AS' 2Az si Az ...
Bernard Dennis Cullity. which shows how an error in S'alone affects the value of
4. By combining Eqs. (11–3), (11–6), and (11–7), we find that the error in 4 due to
the fact that the specimen is off center is given by AS' 2Az si Az ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |