Elements of X-ray Diffraction |
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Page 88
... example . The wavelength of this line is 1.54051A or 1.53740 kX . 3-5 Diffraction directions . What determines the possible directions , i.e. , the possible angles 20 , in which a given crystal can diffract a beam of monochromatic x ...
... example . The wavelength of this line is 1.54051A or 1.53740 kX . 3-5 Diffraction directions . What determines the possible directions , i.e. , the possible angles 20 , in which a given crystal can diffract a beam of monochromatic x ...
Page 120
... examples that some of the information given was not used in the calculations . In ( a ) , for example , the cell was said to contain only one atom , but the shape of the cell was not specified ; in ( b ) and ( c ) , the cells were ...
... examples that some of the information given was not used in the calculations . In ( a ) , for example , the cell was said to contain only one atom , but the shape of the cell was not specified ; in ( b ) and ( c ) , the cells were ...
Page 378
... example , if a sample contains the compound A , B ,, the diffraction method will disclose the pres- ence of A , B , as such , whereas ordinary chemical analysis would show only the presence of elements A and B. Furthermore , if the ...
... example , if a sample contains the compound A , B ,, the diffraction method will disclose the pres- ence of A , B , as such , whereas ordinary chemical analysis would show only the presence of elements A and B. Furthermore , if the ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone