## Elements of X-Ray Diffraction |

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Page 88

For

Combining these equations, we have 2 sin20 = — (h2 + k2 + l2)\ . (3-10) 4a2 This

equation predicts,_for_a particular incident wavelength X and a particular cubic ...

For

**example**, if the crystal is cubic, then X = 2d sin 0 and J_ (h2 + k2 + i2) d?~ a2Combining these equations, we have 2 sin20 = — (h2 + k2 + l2)\ . (3-10) 4a2 This

equation predicts,_for_a particular incident wavelength X and a particular cubic ...

Page 120

Thus, reflections will occur for such planes as (111), (200), and (220) but not for

the planes (100), (210), (112), etc. The reader may have noticed in the previous

Thus, reflections will occur for such planes as (111), (200), and (220) but not for

the planes (100), (210), (112), etc. The reader may have noticed in the previous

**examples**that some of the information given was not used in the calculations.Page 378

For

will disclose the presence of AxBy as such, whereas ordinary chemical analysis

would show only the presence of elements A and B. Furthermore, if the sample ...

For

**example**, if a sample contains the compound AXBV, the diffraction methodwill disclose the presence of AxBy as such, whereas ordinary chemical analysis

would show only the presence of elements A and B. Furthermore, if the sample ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone