## Elements of X-Ray Diffraction |

### From inside the book

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Page 123

It is by these missing reflections, such as 11-1, 11-3, 22-1, 22-3, that a hexagonal

structure is recognized as being close-packed. Not all the reflections present

have the same structure

even ...

It is by these missing reflections, such as 11-1, 11-3, 22-1, 22-3, that a hexagonal

structure is recognized as being close-packed. Not all the reflections present

have the same structure

**factor**. For example, if (h + 2k is a multiple of 3 and I iseven ...

Page 128

Intersection of cones of diffracted rays with Debye-Scherrer film. thus leads to a

third geometrical

diffraction line being 2-irR sin 20g, where R is the tadius of tne camera, tne

relative ...

Intersection of cones of diffracted rays with Debye-Scherrer film. thus leads to a

third geometrical

**factor**affecting the intensity of a reflection. The length of anydiffraction line being 2-irR sin 20g, where R is the tadius of tne camera, tne

relative ...

Page 132

sin 6 cos 6 1 where / = relative integrated intensity (arbitrary units), F = structure

have omitted

sin 6 cos 6 1 where / = relative integrated intensity (arbitrary units), F = structure

**factor**, p = multiplicity**factor**, and 6 = Bragg angle. In arriving at this equation, wehave omitted

**factors**which are constant for all lines of the tern. For example, all ...### What people are saying - Write a review

#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone