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Page 154
6–4 Film loading. Figure 6–5 illustrates three methods of arranging the film strip
in the Debye method. The small sketches on the right show the loaded film in
relation to the incident beam, while the films laid out flat are indicated on the left.
6–4 Film loading. Figure 6–5 illustrates three methods of arranging the film strip
in the Debye method. The small sketches on the right show the loaded film in
relation to the incident beam, while the films laid out flat are indicated on the left.
Page 216
mount sheet or plate specimens with their plane parallel to the plane of the film
and one edge of the sheet or plate parallel to an edge of the film. Irregularly
shaped crystals must have fiducial marks on their surface which will definitely fix
their ...
mount sheet or plate specimens with their plane parallel to the plane of the film
and one edge of the sheet or plate parallel to an edge of the film. Irregularly
shaped crystals must have fiducial marks on their surface which will definitely fix
their ...
Page 218
The hyperbolas running from left to right are curves of constant Y, and any one of
these curves is the locus of diffraction spots from planes of a zone whose axis is
tilted away from the plane of the film by the indicated angle Y. If points having the
...
The hyperbolas running from left to right are curves of constant Y, and any one of
these curves is the locus of diffraction spots from planes of a zone whose axis is
tilted away from the plane of the film by the indicated angle Y. If points having the
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |