Elements of X-ray Diffraction |
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Page 154
... Film loading . Figure 6-5 illustrates three methods of arranging the film strip in the Debye method . The small sketches on the right show the loaded film in relation to the incident beam , while the films laid out flat are indicated on ...
... Film loading . Figure 6-5 illustrates three methods of arranging the film strip in the Debye method . The small sketches on the right show the loaded film in relation to the incident beam , while the films laid out flat are indicated on ...
Page 216
... film placed in the back - reflection position . C = crystal , F film , Z.A. = zone axis . = mount sheet or plate specimens with their plane parallel to the plane of the film and one edge of the sheet or plate parallel to an edge of the ...
... film placed in the back - reflection position . C = crystal , F film , Z.A. = zone axis . = mount sheet or plate specimens with their plane parallel to the plane of the film and one edge of the sheet or plate parallel to an edge of the ...
Page 218
... film distance D. The result is the Greninger chart , graduated at 2 ° inter- vals shown in Fig . 8-3 . The hyperbolas running from left to right are curves of constant y , and any one of these curves is the locus of diffraction spots ...
... film distance D. The result is the Greninger chart , graduated at 2 ° inter- vals shown in Fig . 8-3 . The hyperbolas running from left to right are curves of constant y , and any one of these curves is the locus of diffraction spots ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone