Elements of X-ray Diffraction |
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Page 16
... filter 1.6 1.8 λ ( angstroms ) ( b ) Nickel filter FIG . 1-11 . Comparison of the spectra of copper radiation ( a ) before and ( b ) after passage through a nickel filter ( schematic ) . The dashed line is the mass ab- sorption ...
... filter 1.6 1.8 λ ( angstroms ) ( b ) Nickel filter FIG . 1-11 . Comparison of the spectra of copper radiation ( a ) before and ( b ) after passage through a nickel filter ( schematic ) . The dashed line is the mass ab- sorption ...
Page 212
... filter materials since their K absorption edges ( 1.608 and 1.488A , respec- tively ) effectively bracket the Cu Ka line . Their linear absorption coeffi- cients are plotted in Fig . 7-25 ( a ) , which shows that balancing can be ...
... filter materials since their K absorption edges ( 1.608 and 1.488A , respec- tively ) effectively bracket the Cu Ka line . Their linear absorption coeffi- cients are plotted in Fig . 7-25 ( a ) , which shows that balancing can be ...
Page 420
... filter between the sample and the counter . This filter will absorb most of the Zn Ka and pass most of the Cu Ka radiation . Selective filtration of this kind is most effec- tive when the two elements have either nearly the same atomic ...
... filter between the sample and the counter . This filter will absorb most of the Zn Ka and pass most of the Cu Ka radiation . Selective filtration of this kind is most effec- tive when the two elements have either nearly the same atomic ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone