Elements of X-ray Diffraction |
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Page 404
... fluorescent analysis are still undergoing rapid development , and a wider range of application , to- gether with greater speed and accuracy , can be expected in the near future . 15-2 General principles . Most fluorescent spectrometers ...
... fluorescent analysis are still undergoing rapid development , and a wider range of application , to- gether with greater speed and accuracy , can be expected in the near future . 15-2 General principles . Most fluorescent spectrometers ...
Page 407
... fluorescent radiation will be highly absorbed by the sample , the fluorescent radiation outside the sample comes only from a thin surface skin and its intensity is accordingly low . It fol- lows that detection of small amounts of a ...
... fluorescent radiation will be highly absorbed by the sample , the fluorescent radiation outside the sample comes only from a thin surface skin and its intensity is accordingly low . It fol- lows that detection of small amounts of a ...
Page 416
... fluorescent beam , and this beam itself will undergo less absorption than in the Fe - Ag alloy . The over - all result is that the intensity of the fluorescent Fe Ka radiation outside the specimen is greater for the Fe - Al alloy ...
... fluorescent beam , and this beam itself will undergo less absorption than in the Fe - Ag alloy . The over - all result is that the intensity of the fluorescent Fe Ka radiation outside the specimen is greater for the Fe - Al alloy ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone