Elements of X-ray Diffraction |
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Page 160
... focusing camera for a closer study of certain portions . Some investiga- tors use a set of three Seemann - Bohlin cameras , designed to cover practically the whole range of 20 values in overlapping angular ranges . Diffraction lines ...
... focusing camera for a closer study of certain portions . Some investiga- tors use a set of three Seemann - Bohlin cameras , designed to cover practically the whole range of 20 values in overlapping angular ranges . Diffraction lines ...
Page 171
... focusing monochromators : ( a ) focusing cameras ; ( b ) Debye - Scherrer and flat - film cameras . Only one diffracted beam is shown in each case . ( After A. Guinier , X - ray Crystallographic Technology , Hilger and Watts , Ltd ...
... focusing monochromators : ( a ) focusing cameras ; ( b ) Debye - Scherrer and flat - film cameras . Only one diffracted beam is shown in each case . ( After A. Guinier , X - ray Crystallographic Technology , Hilger and Watts , Ltd ...
Page 185
Bernard Dennis Cullity. F focusing circle \ specimen \ normal diffractometer circle focusing circle specimen normal ( a ) ( b ) FIG . 7-5 . Focusing geometry for flat specimens in ( a ) forward reflection and ( b ) back reflection ...
Bernard Dennis Cullity. F focusing circle \ specimen \ normal diffractometer circle focusing circle specimen normal ( a ) ( b ) FIG . 7-5 . Focusing geometry for flat specimens in ( a ) forward reflection and ( b ) back reflection ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone