Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Page 89
*These examples show that the directions in which a beam of given wavelength
is diffracted by a given set of lattice planes is determined by the crystal system to
which the crystal belongs and its lattice parameters. In short, diffraction directions
...
*These examples show that the directions in which a beam of given wavelength
is diffracted by a given set of lattice planes is determined by the crystal system to
which the crystal belongs and its lattice parameters. In short, diffraction directions
...
Page 116
Or, using the other form given by Eq. (4–8), we have A (cos 4 + i sin (b)A (cos 4 –
i sin (b) = A*(cos” 4 + sin” b) = A*. +. We return now to the problem of adding the
scattered waves from each of the atoms in the unit cell. The amplitude of each ...
Or, using the other form given by Eq. (4–8), we have A (cos 4 + i sin (b)A (cos 4 –
i sin (b) = A*(cos” 4 + sin” b) = A*. +. We return now to the problem of adding the
scattered waves from each of the atoms in the unit cell. The amplitude of each ...
Page 146
If the value of h is smaller than that given by Eq. (5–6), then conditions will be
intermediate between those shown in Figs. 5–8 and 5–9; as h approaches zero,
the maximum divergence angle decreases from the value given by Eq. (5–4) to
that ...
If the value of h is smaller than that given by Eq. (5–6), then conditions will be
intermediate between those shown in Figs. 5–8 and 5–9; as h approaches zero,
the maximum divergence angle decreases from the value given by Eq. (5–4) to
that ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |