Elements of X-ray Diffraction |
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Page 89
Bernard Dennis Cullity. These examples show that the directions in which a beam of given wave- length is diffracted by a given set of lattice planes is determined by the crystal system to which the crystal belongs and its lattice ...
Bernard Dennis Cullity. These examples show that the directions in which a beam of given wave- length is diffracted by a given set of lattice planes is determined by the crystal system to which the crystal belongs and its lattice ...
Page 116
... given by the appropriate value of ƒ for the scattering atom considered and the value of ( sin ) / involved in the reflection . The phase of each wave is given by Eq . ( 4-4 ) in terms of the hkl reflection considered and the uvw ...
... given by the appropriate value of ƒ for the scattering atom considered and the value of ( sin ) / involved in the reflection . The phase of each wave is given by Eq . ( 4-4 ) in terms of the hkl reflection considered and the uvw ...
Page 146
... given by 2v h = d ( 2/12 - 1 ) . и ( 5-6 ) In practice , v is very often about twice as large as u , which means ... given by Eq . ( 5-6 ) , then conditions will be intermediate between those shown in Figs . 5-8 and 5-9 ; as h approaches ...
... given by 2v h = d ( 2/12 - 1 ) . и ( 5-6 ) In practice , v is very often about twice as large as u , which means ... given by Eq . ( 5-6 ) , then conditions will be intermediate between those shown in Figs . 5-8 and 5-9 ; as h approaches ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone