## Elements of X-Ray Diffraction |

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Page 116

Or, using the other form

— i sin 0) = A2(cos2 <t> + sin2 <j>) = A2. "Ir We return now to the problem of

adding the scattered waves from each of the atoms in the unit cell. The amplitude

of ...

Or, using the other form

**given**by Eq. (4-8), we have A (cos <f> + i sin 0)A(cos <t>— i sin 0) = A2(cos2 <t> + sin2 <j>) = A2. "Ir We return now to the problem of

adding the scattered waves from each of the atoms in the unit cell. The amplitude

of ...

Page 146

If the value of h is smaller than that

intermediate between those shown in Figs. 5-8 and 5-9; as h approaches zero,

the maximum divergence angle decreases from the value

that ...

If the value of h is smaller than that

**given**by Eq. (5-6), then conditions will beintermediate between those shown in Figs. 5-8 and 5-9; as h approaches zero,

the maximum divergence angle decreases from the value

**given**by Eq. (5-4) tothat ...

Page 321

4-13) is

(fc + fc -H) is an odd multiple of 2, (10-9) |F|2 = 16(/cd + /Te)2, if (h + k + I) is an

even multiple of 2. Even before making a detailed calculation of relative diffracted

...

4-13) is

**given**by \F\* = 16(Jcd2 + /Te2), if (A + fc + 0 is odd, \F |2 = 16(/cd - /Te)2, if(fc + fc -H) is an odd multiple of 2, (10-9) |F|2 = 16(/cd + /Te)2, if (h + k + I) is an

even multiple of 2. Even before making a detailed calculation of relative diffracted

...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone