Elements of X-ray Diffraction |
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Page 270
... gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to ...
... gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to ...
Page 397
... gives ΙΑ = КЗСА Is K4C8 ( 14-13 ) ( Note that μm , the linear absorption coefficient of the mixture and an un- known quantity , drops out . Physically , this means that variations in absorption , due to variations in the relative ...
... gives ΙΑ = КЗСА Is K4C8 ( 14-13 ) ( Note that μm , the linear absorption coefficient of the mixture and an un- known quantity , drops out . Physically , this means that variations in absorption , due to variations in the relative ...
Page 487
... give good electron - diffraction patterns , since elec- trons are scattered much more intensely than x - rays . These ... gives the wavelength of the neutron beam : λ = h √2mE ( 4 ) The neutrons issuing from a pile have their kinetic ...
... give good electron - diffraction patterns , since elec- trons are scattered much more intensely than x - rays . These ... gives the wavelength of the neutron beam : λ = h √2mE ( 4 ) The neutrons issuing from a pile have their kinetic ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone