Elements of X-ray Diffraction |
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Page 260
... grain - size number . " Although x - ray diffraction is decidedly inferior to microscopic examina- tion in the accurate measurement of grain size , one diffraction photograph can yield semiquantitative information about grain size ...
... grain - size number . " Although x - ray diffraction is decidedly inferior to microscopic examina- tion in the accurate measurement of grain size , one diffraction photograph can yield semiquantitative information about grain size ...
Page 263
... grain and the grain changes its shape , becoming flattened and elongated in the direction of rolling . The change in shape of any one grain is determined not only by the forces applied to the piece as a whole , but also by the fact that ...
... grain and the grain changes its shape , becoming flattened and elongated in the direction of rolling . The change in shape of any one grain is determined not only by the forces applied to the piece as a whole , but also by the fact that ...
Page 266
... grains , which then grow at the expense of one another during the grain - growth stage . The above is a highly oversimplified description of some very complex processes which are not yet completely understood . In particular , the exact ...
... grains , which then grow at the expense of one another during the grain - growth stage . The above is a highly oversimplified description of some very complex processes which are not yet completely understood . In particular , the exact ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone