Elements of X-ray Diffraction |
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Page 94
... beam formed . If this plane is now rotated about the incident beam as axis in such a way that @ is kept constant , then the reflected beam will travel over the surface of a cone as shown in Fig . 3-11 ( b ) , the axis of the cone ...
... beam formed . If this plane is now rotated about the incident beam as axis in such a way that @ is kept constant , then the reflected beam will travel over the surface of a cone as shown in Fig . 3-11 ( b ) , the axis of the cone ...
Page 107
... beam is only a minute fraction of the intensity of the incident beam . The equa- tion also shows that the scattered intensity decreases as the inverse square of the distance from the scattering atom , as one would expect , and that the ...
... beam is only a minute fraction of the intensity of the incident beam . The equa- tion also shows that the scattered intensity decreases as the inverse square of the distance from the scattering atom , as one would expect , and that the ...
Page 185
... incident beam be parallel to the plane of the drawing . This condition is realized as closely as pos- sible experimentally by passing the incident beam through a Soller slit ( Fig . 7-6 ) , slit A in Fig . 7-1 , which contains a set of ...
... incident beam be parallel to the plane of the drawing . This condition is realized as closely as pos- sible experimentally by passing the incident beam through a Soller slit ( Fig . 7-6 ) , slit A in Fig . 7-1 , which contains a set of ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone