Elements of X-ray Diffraction |
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Page 110
... increases as the pro- portion of loosely bound electrons increases . The intensity of Compton modified radiation thus increases as the atomic number Z decreases . It is for this reason that it is difficult to obtain good diffraction ...
... increases as the pro- portion of loosely bound electrons increases . The intensity of Compton modified radiation thus increases as the atomic number Z decreases . It is for this reason that it is difficult to obtain good diffraction ...
Page 130
... increases , i.e. , as the temperature increases , since that increases u , or as increases , since high - 0 reflections involve planes of low d value . Thus the intensity of a diffracted beam decreases as the temperature is raised , and ...
... increases , i.e. , as the temperature increases , since that increases u , or as increases , since high - 0 reflections involve planes of low d value . Thus the intensity of a diffracted beam decreases as the temperature is raised , and ...
Page 151
... increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = = 2d sin 0 1 tan 0 . ( 6-2 ) d But dS do = dd R 20 + Therefore dS dd = 2R d FIG . 6-2 . Geometry of the Debye- Scherrer method . Section ...
... increases with R. The resolving power may be obtained by differentiating the Bragg law : * λ do = = 2d sin 0 1 tan 0 . ( 6-2 ) d But dS do = dd R 20 + Therefore dS dd = 2R d FIG . 6-2 . Geometry of the Debye- Scherrer method . Section ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone