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Page 39
Axial lengths 4A 8A 3A Intercept lengths 2A 6A 3A Fractional intercepts } # 1 --- - -
- 2 # 1 Miller indices | 6 4 3 Miller indices are always cleared of fractions, as
shown above. As stated earlier, if a plane is parallel to a given axis, its fractional ...
Axial lengths 4A 8A 3A Intercept lengths 2A 6A 3A Fractional intercepts } # 1 --- - -
- 2 # 1 Miller indices | 6 4 3 Miller indices are always cleared of fractions, as
shown above. As stated earlier, if a plane is parallel to a given axis, its fractional ...
Page 40
Thus the indices of a plane in the hexagonal system, called Miller-Bravais indices
, refer to four axes and are written (hkil). The index i is the reciprocal of the
fractional intercept on the as axis. Since the intercepts of a plane on a1 and a2 ...
Thus the indices of a plane in the hexagonal system, called Miller-Bravais indices
, refer to four axes and are written (hkil). The index i is the reciprocal of the
fractional intercept on the as axis. Since the intercepts of a plane on a1 and a2 ...
Page 41
These are called planes of a form, and the indices of any one plane, enclosed in
braces {hkl}, stand for the whole set. In general, planes of a form have the same
spacing but different Miller indices. For example, the faces of a cube, (100), (010),
...
These are called planes of a form, and the indices of any one plane, enclosed in
braces {hkl}, stand for the whole set. In general, planes of a form have the same
spacing but different Miller indices. For example, the faces of a cube, (100), (010),
...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |