## Elements of X-Ray Diffraction |

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Page 132

sin 6 cos 6 1 where / = relative

factor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we

have omitted factors which are constant for all lines of the tern. For example, all ...

sin 6 cos 6 1 where / = relative

**integrated intensity**(arbitrary units), F = structurefactor, p = multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we

have omitted factors which are constant for all lines of the tern. For example, all ...

Page 187

But if line intensities are to be compared over the whole range of 26, the same

divergence must be used throughout ... On the other hand, the relative

its ...

But if line intensities are to be compared over the whole range of 26, the same

divergence must be used throughout ... On the other hand, the relative

**integrated****intensity**of a diffraction line is independent of slit width, which is one reason forits ...

Page 395

centered cubic cell; this procedure, in effect, adds together the

experimentally when the

measured. For greatest ...

centered cubic cell; this procedure, in effect, adds together the

**integrated****intensities**of the two lines of the doublet, which is exactly what is doneexperimentally when the

**integrated intensity**of an unresolved doublet ismeasured. For greatest ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

Copyright | |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone