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Page 25
On the other hand, the relative intensities of beams of the same wavelength can
be accurately measured by photographic means, ... Ionization devices measure
the intensity of x-ray beams by the amount of ionization they produce in a gas.
On the other hand, the relative intensities of beams of the same wavelength can
be accurately measured by photographic means, ... Ionization devices measure
the intensity of x-ray beams by the amount of ionization they produce in a gas.
Page 132
where I = relative integrated intensity (arbitrary units), F = structure factor, p =
multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we have
omitted factors which are constant for all lines of the pattern. For example, all that
is ...
where I = relative integrated intensity (arbitrary units), F = structure factor, p =
multiplicity factor, and 6 = Bragg angle. In arriving at this equation, we have
omitted factors which are constant for all lines of the pattern. For example, all that
is ...
Page 417
Bernard Dennis Cullity. Line intensities should be measured with a scaler rather
than taken from a recorded chart. For a given line intensity, the accuracy of the
analysis depends on the time spent in counting, since the relative probable error
in ...
Bernard Dennis Cullity. Line intensities should be measured with a scaler rather
than taken from a recorded chart. For a given line intensity, the accuracy of the
analysis depends on the time spent in counting, since the relative probable error
in ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |