Elements of X-ray Diffraction |
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Page v
... involved , and the main applications . Because the author is a metallurgist , the majority of these applications are described in terms of metals and alloys . However , little or no modification of experimental method is required for ...
... involved , and the main applications . Because the author is a metallurgist , the majority of these applications are described in terms of metals and alloys . However , little or no modification of experimental method is required for ...
Page 332
... involved , systematic and random . A systematic error is one which varies in a regular manner with some particular ... involved in any direct observation . For example , the errors involved in measuring the positions of the various lines ...
... involved , systematic and random . A systematic error is one which varies in a regular manner with some particular ... involved in any direct observation . For example , the errors involved in measuring the positions of the various lines ...
Page 345
... involved . Phase diagrams are therefore of great importance in metallurgy , and much time and effort have been devoted to their determination . In this chapter we will consider how x - ray methods can be used in the study of phase ...
... involved . Phase diagrams are therefore of great importance in metallurgy , and much time and effort have been devoted to their determination . In this chapter we will consider how x - ray methods can be used in the study of phase ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone