Elements of X-ray Diffraction |
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Page 76
... kind per unit cell located at 00 , 0 . ( b ) Four atoms of the same kind per unit cell located at 0 0 z , 0z , 0 † ( } + z ) , 00 ( + z ) . ( c ) Four atoms of the same kind per unit cell located at x y z , x ÿ z , ( † + x ) ( } − y ...
... kind per unit cell located at 00 , 0 . ( b ) Four atoms of the same kind per unit cell located at 0 0 z , 0z , 0 † ( } + z ) , 00 ( + z ) . ( c ) Four atoms of the same kind per unit cell located at x y z , x ÿ z , ( † + x ) ( } − y ...
Page 144
... kind used by dentists , fixed at an angle to the end of a rod . 5-4 Collimators . Collimators of one kind or another are used in all varieties of x - ray cameras , and it is therefore important to understand their function and to know ...
... kind used by dentists , fixed at an angle to the end of a rod . 5-4 Collimators . Collimators of one kind or another are used in all varieties of x - ray cameras , and it is therefore important to understand their function and to know ...
Page 363
... kind of change in the x - ray diffraction pattern of the substance . Evidence of this kind was first obtained by the American metallurgist Bain in 1923 , for a gold - copper solid solution having the composition AuCu3 . Since that time ...
... kind of change in the x - ray diffraction pattern of the substance . Evidence of this kind was first obtained by the American metallurgist Bain in 1923 , for a gold - copper solid solution having the composition AuCu3 . Since that time ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone