Elements of X-ray Diffraction |
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Page 46
... layer and the atoms in the third layer are above the atoms in the first layer , so that the layer stacking sequence can be summarized as ABABAB .... The first two atom layers of an FCC metal are put down in the same way , but the atoms ...
... layer and the atoms in the third layer are above the atoms in the first layer , so that the layer stacking sequence can be summarized as ABABAB .... The first two atom layers of an FCC metal are put down in the same way , but the atoms ...
Page 269
... layer of the specimen . For example , Fig . 9-5 ( a ) was obtained from a piece of copper and exhibits unresolved doublets in the high - angle region . The unexperienced observer might conclude that this material was highly cold worked ...
... layer of the specimen . For example , Fig . 9-5 ( a ) was obtained from a piece of copper and exhibits unresolved doublets in the high - angle region . The unexperienced observer might conclude that this material was highly cold worked ...
Page 270
... layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful ...
... layer and gives no information what- ever about the bulk of the material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone