Elements of X-ray Diffraction |
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Page 80
... length of the path traveled lead to differences in phase . ( 2 ) The introduction of phase differences produces a change in ampli- tude . The greater the path difference , the greater the difference in phase , since the path difference ...
... length of the path traveled lead to differences in phase . ( 2 ) The introduction of phase differences produces a change in ampli- tude . The greater the path difference , the greater the difference in phase , since the path difference ...
Page 126
... length * of the plane . The difference in path length for rays 1 ' and 2 ' scattered by adjacent atoms is given by 81'2 ' = AD - CB = a cos 02 - a cos 01 = a [ cos ( 0B - A0 ) COS ( B + A0 ) ] . By expanding the cosine terms and setting ...
... length * of the plane . The difference in path length for rays 1 ' and 2 ' scattered by adjacent atoms is given by 81'2 ' = AD - CB = a cos 02 - a cos 01 = a [ cos ( 0B - A0 ) COS ( B + A0 ) ] . By expanding the cosine terms and setting ...
Page 158
... length of the film between the knife - edge shadows M and N. Because of variable film shrinkage , these films will generally have unequal lengths . The length of one is taken as a standard , and a multiply- ing factor is found for each ...
... length of the film between the knife - edge shadows M and N. Because of variable film shrinkage , these films will generally have unequal lengths . The length of one is taken as a standard , and a multiply- ing factor is found for each ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone