Elements of X-ray Diffraction |
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Page 76
... located at 00 , 0 . ( b ) Four atoms of the same kind per unit cell located at 0 0 z , 0z , 0 † ( } + z ) , 00 ( + z ) . ( c ) Four atoms of the same kind per unit cell located at x y z , x ÿ z , ( † + x ) ( } − y ) z , ( x ) ( + y ) z ...
... located at 00 , 0 . ( b ) Four atoms of the same kind per unit cell located at 0 0 z , 0z , 0 † ( } + z ) , 00 ( + z ) . ( c ) Four atoms of the same kind per unit cell located at x y z , x ÿ z , ( † + x ) ( } − y ) z , ( x ) ( + y ) z ...
Page 136
... located in the following positions : 000 111 10 111 0 0 111 111 44. A certain tetragonal crystal has four atoms of the same kind per unit cell , located at 0 , 101 , 102 , 01 . ( a ) Derive simplified expressions for F2 . ( b ) What is ...
... located in the following positions : 000 111 10 111 0 0 111 111 44. A certain tetragonal crystal has four atoms of the same kind per unit cell , located at 0 , 101 , 102 , 01 . ( a ) Derive simplified expressions for F2 . ( b ) What is ...
Page 361
... located by any geometrical con- struction but must be determined by experiment . But suppose we measure the parameter of a along some arbitrary line , say the line Abd . Then we can expect the parameter - composition curve to resemble ...
... located by any geometrical con- struction but must be determined by experiment . But suppose we measure the parameter of a along some arbitrary line , say the line Abd . Then we can expect the parameter - composition curve to resemble ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone