Elements of X-ray Diffraction |
From inside the book
Results 1-3 of 59
Page 270
... material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to what depth of the specimen does the information in ...
... material below that layer . These circumstances naturally pose the following question : what is the effective depth of x - ray penetration ? Or , stated in a more useful manner , to what depth of the specimen does the information in ...
Page 277
... material having a fiber texture . F.A. fiber axis . = tional symmetry about an axis in the sense that all orientations about this axis are equally probable . A fiber texture is therefore to be expected in any material formed by forces ...
... material having a fiber texture . F.A. fiber axis . = tional symmetry about an axis in the sense that all orientations about this axis are equally probable . A fiber texture is therefore to be expected in any material formed by forces ...
Page 387
... material . Detection and identification of such deposits is usually an easy matter if the metal object is examined directly by some reflection method of diffraction , without making any attempt to remove the surface deposit for separate ...
... material . Detection and identification of such deposits is usually an easy matter if the metal object is examined directly by some reflection method of diffraction , without making any attempt to remove the surface deposit for separate ...
Other editions - View all
Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone