Elements of X-ray Diffraction |
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Page 130
... mean position is about 0.17A , which is by no means negligible , being about 6 percent of the distance of closest approach of the mean atom positions in this crystal . Thermal agitation decreases the intensity of a diffracted beam ...
... mean position is about 0.17A , which is by no means negligible , being about 6 percent of the distance of closest approach of the mean atom positions in this crystal . Thermal agitation decreases the intensity of a diffracted beam ...
Page 149
... means the strong K characteristic component of the general radiation from an x - ray tube operated above the K excitation potential of the target mate- rial . " Powder " can mean either an actual , physical powder held together with a ...
... means the strong K characteristic component of the general radiation from an x - ray tube operated above the K excitation potential of the target mate- rial . " Powder " can mean either an actual , physical powder held together with a ...
Page 345
... means of a phase diagram , also called an equilibrium diagram or consti- tution diagram . It is a plot of ... means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition ...
... means of a phase diagram , also called an equilibrium diagram or consti- tution diagram . It is a plot of ... means alone . X - ray diffraction , however , supplements these older techniques in many useful ways and provides , in addition ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone