## Elements of X-Ray Diffraction |

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Page 205

Suppose a

low, in the presence of a fairly large unavoidable background. In these

circumstances, Eq. (7-6) does not apply. Let N be the number of pulses counted

in a given ...

Suppose a

**measurement**is required of the diffraction background, always ratherlow, in the presence of a fairly large unavoidable background. In these

circumstances, Eq. (7-6) does not apply. Let N be the number of pulses counted

in a given ...

Page 446

In theory, different slit arrangements are therefore necessary for the

slit position between each of these

compromise ...

In theory, different slit arrangements are therefore necessary for the

**measurement**made at ^ = 0 and the one made at ^ = 45°. In practice, a change inslit position between each of these

**measurements**is avoided by making acompromise ...

Page 449

For the

equations, Eqs. (17-14) and (17-15), one for the pinhole camera and one for the

diffractometer. Each of them contains an appropriate stress factor K, by which

diffraction ...

For the

**measurement**of stress by x-rays we have developed two workingequations, Eqs. (17-14) and (17-15), one for the pinhole camera and one for the

diffractometer. Each of them contains an appropriate stress factor K, by which

diffraction ...

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#### LibraryThing Review

User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review

### Contents

PROPERTIES OF XRAYS | 1 |

THE GEOMETRY OF CRYSTALS | 29 |

THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |

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### Common terms and phrases

absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos2 counter counting rate cubic curve Debye ring Debye-Scherrer decreases density determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method located martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern preferred orientation produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scattering shown in Fig sin2 6 values slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin twin band unit cell vector voltage wave wavelength x-ray diffraction x-ray tube zero zone