Elements of X-ray Diffraction |
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Page 205
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
Page 446
... measured directly . with a diffractometer , it is convenient to write the stress equation in terms of 20 rather than ... measurements on 446 [ CHAP . 17 STRESS MEASUREMENT.
... measured directly . with a diffractometer , it is convenient to write the stress equation in terms of 20 rather than ... measurements on 446 [ CHAP . 17 STRESS MEASUREMENT.
Page 449
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone