Elements of X-ray Diffraction |
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Page 89
... methods : λ Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment . A ...
... methods : λ Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment . A ...
Page 149
... methods and , when properly employed , can yield a great deal of structural information about the material under investigation . Basi- cally , this method involves the diffraction of monochromatic x - rays by a powder specimen . In this ...
... methods and , when properly employed , can yield a great deal of structural information about the material under investigation . Basi- cally , this method involves the diffraction of monochromatic x - rays by a powder specimen . In this ...
Page 510
... method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect structures , 317 , 353 Deformation texture , 273 Deformation twins , 58 ...
... method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect structures , 317 , 353 Deformation texture , 273 Deformation twins , 58 ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cosē counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sinē slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone