Elements of X-ray Diffraction |
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Page 88
... obtained from the ( 100 ) planes by using a beam incident at the correct angle 01 , 02 , 03 , and producing ... first- , second- , third- , order reflections . But diffraction can also be produced by the ( 110 ) planes , the ( 111 ) ...
... obtained from the ( 100 ) planes by using a beam incident at the correct angle 01 , 02 , 03 , and producing ... first- , second- , third- , order reflections . But diffraction can also be produced by the ( 110 ) planes , the ( 111 ) ...
Page 133
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
Page 382
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone