Elements of X-ray DiffractionThis is a reproduction of a book published before 1923. This book may have occasional imperfections such as missing or blurred pages, poor pictures, errant marks, etc. that were either part of the original artifact, or were introduced by the scanning process. We believe this work is culturally important, and despite the imperfections, have elected to bring it back into print as part of our continuing commitment to the preservation of printed works worldwide. We appreciate your understanding of the imperfections in the preservation process, and hope you enjoy this valuable book. |
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Results 1-3 of 86
Page 88
What determines the possible directions, i.e., the possible angles 20, in which a
given crystal can diffract a beam of monochromatic X-rays? Referring to Fig. 3-3,
we see that various diffraction angles 201, 202, 203, ... can be obtained from the
...
What determines the possible directions, i.e., the possible angles 20, in which a
given crystal can diffract a beam of monochromatic X-rays? Referring to Fig. 3-3,
we see that various diffraction angles 201, 202, 203, ... can be obtained from the
...
Page 133
Column 7: Obtained from Appendix 7. Needed to determine fou. Column 8: Read
from the curve of Fig. 4–6. Column 9: Obtained from the relation F" = 16fcu".
Column 10: Obtained from Appendix 9. In this and similar calculations, slide-rule
...
Column 7: Obtained from Appendix 7. Needed to determine fou. Column 8: Read
from the curve of Fig. 4–6. Column 9: Obtained from the relation F" = 16fcu".
Column 10: Obtained from Appendix 9. In this and similar calculations, slide-rule
...
Page 382
(Most of the data in the ASTM file were obtained with a Debye–Scherrer camera
and Mo Ko, radiation. Since a change in wavelength alters the relative intensities
of the diffraction lines, this means that a pattern made with Cu Ko radiation, ...
(Most of the data in the ASTM file were obtained with a Debye–Scherrer camera
and Mo Ko, radiation. Since a change in wavelength alters the relative intensities
of the diffraction lines, this means that a pattern made with Cu Ko radiation, ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |