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Page 82
It states the essential condition which must be met if diffraction is to occur. n is
called the order of reflection; it may take on any integral value consistent with sin
0 not exceeding unity and is equal to the number of wavelengths in the path ...
It states the essential condition which must be met if diffraction is to occur. n is
called the order of reflection; it may take on any integral value consistent with sin
0 not exceeding unity and is equal to the number of wavelengths in the path ...
Page 112
satisfied, no diffracted be W - law may be satisfied for a certain set of atomic
planes and yet no diffraction may occur, as in the example given at the beginning
of this chapter. Because of a particular arrangement of atoms within the unit cell [
Fig.
satisfied, no diffracted be W - law may be satisfied for a certain set of atomic
planes and yet no diffraction may occur, as in the example given at the beginning
of this chapter. Because of a particular arrangement of atoms within the unit cell [
Fig.
Page 196
Bernard Dennis Cullity. decreases more slowly to its normal value. All pulses
have the same amplitude and are spaced at random time intervals. But if the rate
of pulse production is so high that two successive pulses occur too closely
together, ...
Bernard Dennis Cullity. decreases more slowly to its normal value. All pulses
have the same amplitude and are spaced at random time intervals. But if the rate
of pulse production is so high that two successive pulses occur too closely
together, ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |