Elements of X-ray Diffraction |
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Page 215
... orientation of the single crystal test specimen in order that measure- ments may be made along known crystallographic directions or planes . By varying the crystal orientation , we can obtain data on the property measured ( e.g. , yield ...
... orientation of the single crystal test specimen in order that measure- ments may be made along known crystallographic directions or planes . By varying the crystal orientation , we can obtain data on the property measured ( e.g. , yield ...
Page 273
... orientation of the individual grains is produced by the deformation imposed on the aggregate as a whole . When a cold - worked metal or alloy , possessed of a deformation texture , is recrystallized by annealing , the new grain ...
... orientation of the individual grains is produced by the deformation imposed on the aggregate as a whole . When a cold - worked metal or alloy , possessed of a deformation texture , is recrystallized by annealing , the new grain ...
Page 274
... orientation is solely a crystallographic condition and has nothing to do with grain shape as disclosed by the micro- scope . Therefore , the presence or absence of preferred orientation cannot be disclosed by microscopic examination ...
... orientation is solely a crystallographic condition and has nothing to do with grain shape as disclosed by the micro- scope . Therefore , the presence or absence of preferred orientation cannot be disclosed by microscopic examination ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone