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Page 38
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis, because such a plane does not intercept that axis, i.e., its “
intercept” can only be described as “infinity.” To avoid the introduction of infinity
into the ...
But a difficulty then arises when the given plane is parallel to a certain
crystallographic axis, because such a plane does not intercept that axis, i.e., its “
intercept” can only be described as “infinity.” To avoid the introduction of infinity
into the ...
Page 256
For example, precipitation of an HCP phase from an FCC solid solution often
occurs in such a way that the basal (0001) plane of the precipitate is parallel to a
(111) plane of the matrix, since on both of these planes the atoms have a habit ...
For example, precipitation of an HCP phase from an FCC solid solution often
occurs in such a way that the basal (0001) plane of the precipitate is parallel to a
(111) plane of the matrix, since on both of these planes the atoms have a habit ...
Page 276
Or a given reflection may be of abnormally high intensity, which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface. As an illustration, the 200 diffractometer reflection
from a ...
Or a given reflection may be of abnormally high intensity, which would indicate
that the corresponding planes were preferentially oriented parallel or nearly
parallel to the sheet surface. As an illustration, the 200 diffractometer reflection
from a ...
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User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |