Elements of X-ray Diffraction |
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Page 207
... percent of its initial value in a time equal to RC and to 1 percent in a time equal to 4.6RC . = pulse input с a S A complete ratemeter circuit consists of two parts . The first is a pulse- amplifying and pulse - shaping portion which ...
... percent of its initial value in a time equal to RC and to 1 percent in a time equal to 4.6RC . = pulse input с a S A complete ratemeter circuit consists of two parts . The first is a pulse- amplifying and pulse - shaping portion which ...
Page 325
... percent error in @ leads to an error in sin of only 0.1 percent . Stated in another way , the angular position of a diffracted beam is much more sensi- tive to a given change in plane spacing when is large than when it is small . We can ...
... percent error in @ leads to an error in sin of only 0.1 percent . Stated in another way , the angular position of a diffracted beam is much more sensi- tive to a given change in plane spacing when is large than when it is small . We can ...
Page 355
... percent B. The composition at which the ratio IB / Ia extrapolates to zero is taken as the point x . ( Use of the ratio Is / Ia rather than Is alone eliminates the effect of any change which may occur in the intensity of the incident ...
... percent B. The composition at which the ratio IB / Ia extrapolates to zero is taken as the point x . ( Use of the ratio Is / Ia rather than Is alone eliminates the effect of any change which may occur in the intensity of the incident ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone