Elements of X-ray Diffraction |
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Page 152
... pinhole system which collimates the incident beam is important , especially when weak dif- fracted beams must be recorded . The exit pinhole scatters x - rays in all di- rections , and these scattered rays , if not prevented from ...
... pinhole system which collimates the incident beam is important , especially when weak dif- fracted beams must be recorded . The exit pinhole scatters x - rays in all di- rections , and these scattered rays , if not prevented from ...
Page 163
... Pinhole photographs . When monochromatic radiation is used to examine a polycrystalline specimen in a Laue camera , the result is called , for no particularly good reason , a pinhole photograph ... PINHOLE PHOTOGRAPHS 6-9 Pinhole photographs.
... Pinhole photographs . When monochromatic radiation is used to examine a polycrystalline specimen in a Laue camera , the result is called , for no particularly good reason , a pinhole photograph ... PINHOLE PHOTOGRAPHS 6-9 Pinhole photographs.
Page 295
... pinhole photograph should not be over- looked . It is surprising how much information an experienced observer can obtain simply by inspection of a pinhole photograph , without any knowledge of the specimen , i.e. , without knowing its ...
... pinhole photograph should not be over- looked . It is surprising how much information an experienced observer can obtain simply by inspection of a pinhole photograph , without any knowledge of the specimen , i.e. , without knowing its ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone