Elements of X-ray Diffraction |
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Page 38
... plane is parallel to a certain crystallographic axis , because such a plane does not intercept that axis , i.e. , its " intercept " can only be described as " infinity . " To avoid the introduction of infinity into the description of plane ...
... plane is parallel to a certain crystallographic axis , because such a plane does not intercept that axis , i.e. , its " intercept " can only be described as " infinity . " To avoid the introduction of infinity into the description of plane ...
Page 60
... plane relative to some reference plane as by the inclination of the plane itself . All the planes in a crystal can thus be represented by a set of plane normals radiating from some one point within the crystal . If a reference sphere is ...
... plane relative to some reference plane as by the inclination of the plane itself . All the planes in a crystal can thus be represented by a set of plane normals radiating from some one point within the crystal . If a reference sphere is ...
Page 217
... plane of the film . The beam re- flected by the plane shown strikes the film at S. The normal to this reflect- ing plane is CN and the plane itself is assumed to belong to a zone whose axis lies in the yz - plane . If we imagine this plane ...
... plane of the film . The beam re- flected by the plane shown strikes the film at S. The normal to this reflect- ing plane is CN and the plane itself is assumed to belong to a zone whose axis lies in the yz - plane . If we imagine this plane ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone