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Page 38
The orientation of planes in a lattice may also be represented symbolically,
according to a system popularized by the English crystallographer Miller. In the
general case, the given plane will be tilted with respect to the crystallographic
axes, ...
The orientation of planes in a lattice may also be represented symbolically,
according to a system popularized by the English crystallographer Miller. In the
general case, the given plane will be tilted with respect to the crystallographic
axes, ...
Page 60
The orientation of any plane in a crystal can be just as well represented by the
inclination of the normal to that plane relative to some reference ... All the planes
in a crystal can thus be represented by a set of plane normals radiating from
some ...
The orientation of any plane in a crystal can be just as well represented by the
inclination of the normal to that plane relative to some reference ... All the planes
in a crystal can thus be represented by a set of plane normals radiating from
some ...
Page 256
twins in copper have {111} composition planes to determine the orientation of the
grain shown in Fig. ... Unfortunately, it is not the only one: the orientation found by
reflecting the one shown in the plane of projection is also a possible solution.
twins in copper have {111} composition planes to determine the orientation of the
grain shown in Fig. ... Unfortunately, it is not the only one: the orientation found by
reflecting the one shown in the plane of projection is also a possible solution.
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYs | 1 |
THE GEOMETRY OF CRYSTALs | 29 |
THE DIRECTIONs of DIFFRACTED BEAMs | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains continuous copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |