Elements of X-ray Diffraction |
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Page 41
... planes related by symmetry . These are called planes of a form , and the indices of any one plane , enclosed in braces ( hkl ) , stand for the whole set . In general , planes of a form have the same spacing but different Miller indices ...
... planes related by symmetry . These are called planes of a form , and the indices of any one plane , enclosed in braces ( hkl ) , stand for the whole set . In general , planes of a form have the same spacing but different Miller indices ...
Page 97
... planes is only a quarter wavelength . These rays do not annul one another but , as we saw in Fig . 3-1 , simply ... planes deeper in the crystal . Under the assumed conditions , the rays scattered by the second and third planes would ...
... planes is only a quarter wavelength . These rays do not annul one another but , as we saw in Fig . 3-1 , simply ... planes deeper in the crystal . Under the assumed conditions , the rays scattered by the second and third planes would ...
Page 124
... planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams diffracted by them all form part of the ...
... planes . Other crystals of different orientation may be in such a position that reflection can occur from their ( 010 ) or ( 001 ) planes . Since all these planes have the same spacing , the beams diffracted by them all form part of the ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone