Elements of X-ray Diffraction |
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Page 27
... Plot the ratio of transmitted to incident intensity vs. thickness of lead sheet for Mo Ka radiation and a thickness range of 0.00 to 0.02 mm . 1-5 . Graphically verify Eq . ( 1-13 ) for a lead absorber and Mo Ka , Rh Ka , and Ag Ka ...
... Plot the ratio of transmitted to incident intensity vs. thickness of lead sheet for Mo Ka radiation and a thickness range of 0.00 to 0.02 mm . 1-5 . Graphically verify Eq . ( 1-13 ) for a lead absorber and Mo Ka , Rh Ka , and Ag Ka ...
Page 225
... plot directly the axis of this zone without plotting the poles of any of the planes belonging to it . The procedure is illustrated in Fig . 8-9 . Keeping the centers of film and chart coincident , we rotate the film about this center ...
... plot directly the axis of this zone without plotting the poles of any of the planes belonging to it . The procedure is illustrated in Fig . 8-9 . Keeping the centers of film and chart coincident , we rotate the film about this center ...
Page 258
... Plot these spots on a sheet of graph paper graduated in inches . By means of a Greninger chart , determine the orientation of the crystal , plot all poles of the form { 100 } , { 110 } , and { 111 } , and give the coordinates of the ...
... Plot these spots on a sheet of graph paper graduated in inches . By means of a Greninger chart , determine the orientation of the crystal , plot all poles of the form { 100 } , { 110 } , and { 111 } , and give the coordinates of the ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone