Elements of X-ray Diffraction |
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Page 88
... possible directions , i.e. , the possible angles 20 , in which a given crystal can diffract a beam of monochromatic x - rays ? Referring to Fig . 3-3 , we see that various diffrac- tion angles 201 , 202 , 203 , ... can be obtained from ...
... possible directions , i.e. , the possible angles 20 , in which a given crystal can diffract a beam of monochromatic x - rays ? Referring to Fig . 3-3 , we see that various diffrac- tion angles 201 , 202 , 203 , ... can be obtained from ...
Page 256
... possible by a further rotation about the axis AB to bring the { 111 } poles of the standard , shown by open symbols , to positions lying on trace normals , shown by solid symbols . The solid symbols therefore show an orientation of the ...
... possible by a further rotation about the axis AB to bring the { 111 } poles of the standard , shown by open symbols , to positions lying on trace normals , shown by solid symbols . The solid symbols therefore show an orientation of the ...
Page 272
... possible in some applications . Then a and 8 in Eq . ( 9-3 ) must be as large as possible , indicating the use of high- angle lines , and μ as small as possible , indicating short - wavelength radia- tion . Other applications may demand ...
... possible in some applications . Then a and 8 in Eq . ( 9-3 ) must be as large as possible , indicating the use of high- angle lines , and μ as small as possible , indicating short - wavelength radia- tion . Other applications may demand ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone