Elements of X-ray Diffraction |
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Page 4
... produced by the oscil- lation of charge back and forth in the broadcasting antenna , and visible light by ... produced when any electri- cally charged particle of sufficient kinetic energy is rapidly decelerated . Electrons are usually ...
... produced by the oscil- lation of charge back and forth in the broadcasting antenna , and visible light by ... produced when any electri- cally charged particle of sufficient kinetic energy is rapidly decelerated . Electrons are usually ...
Page 94
... produced by various metal powders , are shown in Fig . 3-13 . Each diffrac- tion line is made up of a large number ... produced the line . = Conversely , if the shape and size of the unit cell of the crystal are known , we can predict ...
... produced by various metal powders , are shown in Fig . 3-13 . Each diffrac- tion line is made up of a large number ... produced the line . = Conversely , if the shape and size of the unit cell of the crystal are known , we can predict ...
Page 407
... produced in elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The ...
... produced in elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The ...
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Common terms and phrases
a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone