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Page 62
Of the many known kinds of projections, he usually chooses a more or less equal
-area projection so that countries of equal area will be represented by equal
areas on the map. In crystallography, however, we prefer the equiangular ...
Of the many known kinds of projections, he usually chooses a more or less equal
-area projection so that countries of equal area will be represented by equal
areas on the map. In crystallography, however, we prefer the equiangular ...
Page 69
We have already seen that rotation about an axis normal to the projection is
accomplished simply by rotation of the projection around the center-of the Wulff
net. Rotation about an axis lying in the plane of the projection is performed by,
first, ...
We have already seen that rotation about an axis normal to the projection is
accomplished simply by rotation of the projection around the center-of the Wulff
net. Rotation about an axis lying in the plane of the projection is performed by,
first, ...
Page 71
In dealing with problems of crystal orientation a standard projection is of very
great value, since it shows at a glance the relative orientation of all the important
planes in the crystal. Such a projection is made by selecting some important
crystal ...
In dealing with problems of crystal orientation a standard projection is of very
great value, since it shows at a glance the relative orientation of all the important
planes in the crystal. Such a projection is made by selecting some important
crystal ...
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LibraryThing Review
User Review - ron_benson - LibraryThingExcellent reference book. Needs some updating in terms of advances in detector technology. Read full review
Contents
PROPERTIES OF XRAYS | 1 |
THE GEOMETRY OF CRYSTALS | 29 |
THE DIRECTIONS OF DIFFRACTED BEAMS | 78 |
Copyright | |
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Elements of X-ray Diffraction Bernard Dennis Cullity,Stuart R. Stock,Stuart R.. Stock Snippet view - 2001 |
Common terms and phrases
absorption alloy analysis angle applied atoms axis Bragg calculated camera cause circle composition consider constant contains copper counter counting crystal cubic curve decreases depends described determined diffracted beam diffraction lines diffractometer direction distance effect electrons elements energy equal equation error example factor Figure film fluorescent given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue length located material means measured metal method normal observed obtained occur orientation parallel parameter particular pattern percent phase photograph plane plotted pole position possible powder produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown shown in Fig shows simple single slit solid solution spacing specimen stress structure substance surface temperature thickness tion tube twin unit cell usually vector voltage wave wavelength x-ray
Bibliographic information
| Title | Elements of X-ray Diffraction Volume 5 of Addison-Wesley metallurgy series Volume 1230 of Addison-Wesley series in metallurgy and materials |
| Author | Bernard Dennis Cullity |
| Edition | 3 |
| Publisher | Addison-Wesley Publishing Company, 1956 |
| ISBN | 0201012308, 9780201012309 |
| Length | 514 pages |
| Export Citation | BiBTeX EndNote RefMan |