Elements of X-ray Diffraction |
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Page 126
... proportional to 1 / cos @B . The inte- grated intensity of the reflection is given by the area under the diffraction curve and is therefore proportional to the product I maxB , which is in turn proportional to ( 1 / sin 0B ) ( 1 / cos B ) ...
... proportional to 1 / cos @B . The inte- grated intensity of the reflection is given by the area under the diffraction curve and is therefore proportional to the product I maxB , which is in turn proportional to ( 1 / sin 0B ) ( 1 / cos B ) ...
Page 174
... proportional to the exposure up to a density of about 1.0 ( which corre- sponds to 10 percent transmission of the incident light ) . Here , " exposure " is defined by the relation Exposure = ( intensity of x - ray beam ) ( time ) ...
... proportional to the exposure up to a density of about 1.0 ( which corre- sponds to 10 percent transmission of the incident light ) . Here , " exposure " is defined by the relation Exposure = ( intensity of x - ray beam ) ( time ) ...
Page 192
... proportional counter 104 i avalanche region ionization I 1 chamber VOLTAGE FIG . 7-10 . Effect of voltage on the gas amplification factor . ( H. Friedman , Proc . I.R.E. 37 , 791 , 1949. ) tion do not acquire enough energy to ionize ...
... proportional counter 104 i avalanche region ionization I 1 chamber VOLTAGE FIG . 7-10 . Effect of voltage on the gas amplification factor . ( H. Friedman , Proc . I.R.E. 37 , 791 , 1949. ) tion do not acquire enough energy to ionize ...
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a₁ absorption coefficient absorption edge alloy analysis angle atomic number austenite axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera circle composition constant copper atoms cos² counter cubic curve Debye ring Debye-Scherrer decrease determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance electrons elements equation error example face-centered face-centered cubic factor film fluorescent fluorescent radiation given grain hexagonal incident beam indices integrated intensity lattice parameter martensite measured metal normal obtained orientation Orthorhombic parallel percent phase photograph pinhole pole figure position powder pattern produced projection pulses rays reciprocal lattice reciprocal-lattice reflecting planes relative residual stress rhombohedral rotation sample scattering shown in Fig sin² slit solid solution spacing specimen spectrometer sphere spot stereographic substance surface temperature tetragonal thickness tion transmission twin unit cell values vector voltage wave wavelength x-ray diffraction x-ray method x-ray tube zero zone